Invited speakers

Keynote speaker

David Attwood (University of California, Berkeley, USA)

Advances in X-ray and EUV Optics Lead to Broadly Based Scientific and Industrial Opportunities

Invited speakers

Catherine Burcklen (Lawrence Livermore National Laboratory, USA)

Advances in hard x-ray aperiodic multilayers for imaging with large field of view

Ani Chandrasekaran (University of Twente, The Netherlands)

Metal-on-metal interface formation laws of nanoscale thin films

Elena Filatova (Saint-Petersburg State University, Russia)

X-Ray Spectroscopic Methods for Thin Films and Interfaces Study

Qiushi Huang (Tongji University, China)

Multilayer coated nanogratings with sub-50 nm periodicity for ultrahigh resolution soft X-ray spectroscopy

Ryuji Maruyama (Japan Atomic Energy Agency, Japan)

Recent progress in the development of neutron polarizing supermirror at J-PARC

Christian Morawe (European Synchrotron Radiation Facility, France)

Multilayer x-ray optics at the ESRF

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