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The booklet of the PXRNMS 2018 Workshop is available at :

https://pxrnms2018.sciencesconf.org/data/pages/booklet_PXRNMS2018_diff.pdf

Join the LinkedIn Group "Physics of X-ray and Neutron Multilayer Structures" : https://www.linkedin.com/groups/8680424

On behalf of the Laboratoire Charles Fabry, Institut d'Optique Graduate School and

the Laboratoire de Chimie Physique - Matière et Rayonnement, Sorbonne Université and CNRS,

we invite you to attend the

PXRNMS2018 International Workshop 

 Wednesday November 7 - Friday November 9  2018

at the University Paris-Saclay Campus, EDF convention center, Palaiseau, France.

This workshop follows the fruitful PXRNMS 2016 workshop organized by the colleagues of the Industrial Focus Group XUV at MESA+ at the University of Twente, The Netherlands, as well as the former PXRMS conferences that were successfully organized for many years but ended in 2010. We gladly invite graduate students, young researchers and senior scientists, both from academia and industry to participate, so please mark your calendars.

The Workshop will focus on the physics of nanometer-scale multilayer films optimized for various applications in the Extreme Ultraviolet (EUV) and X-ray domains as well as neutron optics. The main topics that will be discussed include:

Multilayer X-Ray and Neutron Optics                                 Multilayer Design and Modeling
Film Growth and  Microstructure                                       Roughness and Interface Formation
Surface and Thin-Film Modifications using Ion Beams         Film Removal Techniques
Growth Models and Computer Simulations                         X-Ray and Neutron Scattering
Surface and Interface Topography                                     Layer and Interface Composition
Wavefront Characterization and Correction                       Mechanical Properties and Stability
Optical Properties                                                             Novel Characterization Techniques
Polarization Control                                                          Metrology