› Advances in hard x-ray aperiodic multilayers for imaging with large field of view - Catherine Burcklen, Lawrence Livermore National Laboratory (invited)
09:05-09:30 (25min)
› Multilayer mirrors based on beryllium for an extreme ultraviolet range - Vladimir Polkovnikov, Institute for Physics of Microstructures of the RAS
09:30-09:50 (20min)
› Recent advances in development of Cr/Sc based reflective multilayer coatings for x-ray applications - Evgueni Meltchakov, Laboratoire Charles Fabry
09:50-10:10 (20min)
› Chromatic Aberration Control on Microscope Imaging System with EUV Multilayer Mirrors - Mitsunori Toyoda, Tohoku University [Sendai], Tokyo Polytechnic University
10:10-10:30 (20min)
› X-Ray Spectroscopic Methods for Thin Films and Interfaces Study - Elena Filatova, Institute of Physics, St-Petersburg State University, Ulyanovskaya Str. 3, Peterhof, 198504, St. Petersburg (invited)
10:55-11:20 (25min)
› Proximity effect in Co/Pt multilayer investigated through X-ray resonant magnetic reflectivity - Adriano Verna, Università degli Studi Roma Tre
11:20-11:40 (20min)
› Angle-Resolved XRF for Depth-Resolved Elemental Analysis of Stratified Materials in the Laboratory - Jonas Baumann, Technical University Berlin
11:40-12:00 (20min)
› Correlated lateral density fluctuations in the Si layers of a W/Si multilayer revealed by GISAXS - Igor Makhotkin, University of Twente
12:00-12:20 (20min)
› Study of Pd/Y multilayers with B4C barrier layers using GIXR and x-ray standing wave enhanced HAXPES - Meiyi Wu, Sorbonne Université, Faculté des Sciences et Ingénierie, UMR CNRS, Laboratoire de Chimie Physique - Matière et Rayonnement
12:20-12:40 (20min)