Physics of X-Ray and Neutron Multilayer Structures

PXRNMS2018

7-9 Nov 2018 Palaiseau (France)

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Program

Wednesday, November 7, 2018

08:00

09:00

10:00

11:00

12:00

13:00

14:00

15:00

16:00

17:00

18:00

›8:00 (1h10)

Registration and Welcome coffee

› Coffee break and exhibition hall

8:00 - 9:10 (1h10)

Registration and Welcome coffee

Coffee break and exhibition hall

›9:10 (10min)

Welcome speech

› Conference room

9:10 - 9:20 (10min)

Welcome speech

Conference room

›9:20 (1h20)

Session 1
Chairwoman Regina Soufli

› Conference room

9:20 - 10:40 (1h20)

Session 1

Conference room

Chairwoman Regina Soufli

› Advances in X-ray and EUV Optics Lead to Broadly Based Scientific and Industrial Opportunities - David Attwood, University of California, Berkeley 09:20-10:00 (40min)

› Piezoelectric actuators for adaptive multilayer mirrors in XUV lithography systems - Mohammadreza Nematollahi, University of Twente [Netherlands] 10:00-10:20 (20min)

› Extreme ultraviolet multilayers for solar physics applications - Alain Jody Corso, National Research Council of Italy 10:20-10:40 (20min)

›10:40 (25min)

Coffee break

› Coffee break and exhibition hall

10:40 - 11:05 (25min)

Coffee break

Coffee break and exhibition hall

›11:05 (1h25)

Session 2
Cairman Qiushi Huang

› Conference room

11:05 - 12:30 (1h25)

Session 2

Conference room

Cairman Qiushi Huang

› Recent progress in the development of neutron polarizing supermirror at J-PARC - Ryuji Maruyama, J-PARC Center, Japan Atomic Energy Agency (invited) 11:05-11:30 (25min)

› Improved interface widths in Ni/Ti multilayer mirrors by ion-assisted B4C co-deposition - Sjoerd Broekhuijsen, Thin Film Physics Division, Department of Physics, Chemistry and Biology (IFM), Linköping University, SE-581 83 Linköping, Sweden 11:30-11:50 (20min)

› Neutron polarizing supermirrors for the WASP instrument at the ILL: the end of a mass production coating project. - Thierry Bigault, Institut Laue-Langevin 11:50-12:10 (20min)

› Large area neutron supermirror and X-ray multilayer mirror deposition facility at Bhabha Atomic Research Centre INDIA - Arup Biswas, Bhabha Atomic Research Centre 12:10-12:30 (20min)

›12:30 (1h30)

Lunch

› Canteen

12:30 - 14:00 (1h30)

Lunch

Canteen

›14:00 (1h45)

Session 3
Chairman Eric Louis

› Conference room

14:00 - 15:45 (1h45)

Session 3

Conference room

Chairman Eric Louis

› Metal-on-metal interface formation laws of nanoscale thin films - Anirudhan Chandrasekaran, Industrial Focus Group XUV Optics, MESA+ institute for Nanotechnology, University of Twente, The Netherlands (invited) 14:00-14:25 (25min)

› Optical constants with improved accuracy in the regions of L-, M- N- and O-absorption edges and their impact in multilayer modeling - Regina Soufli, Lawrence Livermore National Laboratory, Laboratoire Charles Fabry 14:25-14:45 (20min)

› Growth of Mo/Si multilayers at oblique deposition induces periodical nano-arrays - Dmitriy Voronov, Lawrence Berkeley National Laboratory 14:45-15:05 (20min)

› Atomic oxygen diffusion in ultrathin transition metal oxide films at near room temperature - Cristiane Stilhano Vilas Boas, MESA+ Institute for Nanotechnology, University of Twente 15:05-15:25 (20min)

› Manufacturing and characterization of substrates for imaging multilayer X-ray optics - Nikolai Chkhalo, Institute for Physics of Microstructures of Russian Academy of Sciences 15:25-15:45 (20min)

›15:45 (2h15)

Poster session and coffee break

› Coffee break and exhibition hall

15:45 - 18:00 (2h15)

Poster session and coffee break

Coffee break and exhibition hall

› Advancing X-ray standing wave data analysis - Igor Makhotkin, University of Twente 15:45-18:00 (2h15)

› Angular distribution of a characteristic x-ray emission transmitted by a periodic multilayer - Karine Le Guen, Laboratoire de Chimie Physique - Matière et Rayonnement, Sorbonne Université-CNRS 15:45-18:00 (2h15)

› ATTOLAB SE10: a versatile and integrated beamline for attosecond physics on gases and surfaces - David Bresteau, LIDYL, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette, France 15:45-18:00 (2h15)

› Characterization of a monochromatic x-ray imaging using Fresnel zone plates and a multilayer mirror - Annaig CHALEIL, CEA DAM 15:45-18:00 (2h15)

› Characterization of a multilayer x-ray waveguide by x-ray diffuse scattering and grazing incidence x-ray fluorescence - Philippe Jonnard, Laboratoire de Chimie Physique - Matière et Rayonnement - Jussieu 15:45-18:00 (2h15)

› Combined XRR-GIXRF analysis at SOLEIL - Yves Ménesguen, CEA 15:45-18:00 (2h15)

› Dedicated X-ray optics for new generation small X-ray sources - Markus Krämer, AXO DRESDEN GmbH 15:45-18:00 (2h15)

› Derivation of beryllium optical constants from Mo/Be multilayers - Mewael Giday Sertsu, BESSY II, Helmholtz - Zentrum Berlin 15:45-18:00 (2h15)

› Explosive crystallization of Co layers in C/Co/C three-layers - Oleksandr Devizenko, National Technical University “Kharkiv Polytechnic Institute” 15:45-18:00 (2h15)

› Influence of nanometer protective layers on temporal stability and mechanical properties of thin-film aluminium absorption filters - Nikolay Tsybin, Institute of Applied Physics of RAS 15:45-18:00 (2h15)

› Layer structure and phase composition in W/Si multilayer X-ray mirrors - Vitalii Chumak, National Technical University “Kharkiv Polytechnic Institute” 15:45-18:00 (2h15)

› Modeling of EUV multilayers and filters for solar physics and evaluation of tabulated optical constants - 15:45-18:00 (2h15)

› Multilayer-based high-precision polarimeter at Diamond Light Source - Hongchang Wang, Diamond Light Source 15:45-18:00 (2h15)

› Observation of Polymer Blend Films on Transmission EUV Microscopy - Mitsunori Toyoda, Tohoku University [Sendai], Tokyo Polytechnic University 15:45-18:00 (2h15)

› Optical properties of graphene at hydrogen Lyman alpha - NADEEM AHMED MALIK, Department of Information Engineering, University of Padova, via Gradenigo 6B, 35131 Padova, Italy, CNR-IFN UOS Padova, Via Trasea 7, 35131 Padova, Italy 15:45-18:00 (2h15)

› Progress on Multilayer-coated Optics for High Energy X-ray Imaging Tools at the US National Labs - Chris Walton, Lawrence Livermore National Laboratory 15:45-18:00 (2h15)

› Spatially resolved EUV and XUV reflectometry - Frank Scholze, Physikalisch-Technische Bundesanstalt 15:45-18:00 (2h15)

› Study on propagation of interface imperfections across Co/Ti multilayers with ultra-short period - Piyali Sarkar, Bhabha Atomic Research Center - Arup Biswas, Bhabha Atomic Research Centre - Dibyendu Bhattacharyya, Bhabha Atomic Research Centre 15:45-18:00 (2h15)

› Surface and interface observation of Zirconium oxynitride films as well as TiN/ZrON bilayers - Yanyan Yuan, Jiangsu University of Science and Technology 15:45-18:00 (2h15)

› Trends on Montel X-ray Optics for Inelastic Scattering and Microfocus X-ray Sources for X-ray Diffractometry - Frank Hertlein, incoatec GmbH 15:45-18:00 (2h15)

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